Equipment Portfolio

Our Equipment Portfolio allows you to browse scientific and experimental infrastructure of our faculty using a range of search criteria. Of course, our devices are not only available to faculty members, but also to researchers outside the faculty or university in the framework of a research cooperation. For every device, a contact person can provide advice on measurements.

Faculty members are only charged for the operating costs as well as for the proportional regular maintenance costs. People outside the faculty who use our equipment are additionally charged for the proportional repair costs incurred. Outside of the university, depreciation is included in the proportional total costs.

Please refer to the relevant contact person if you require further information or if you want to use a device. For general questions regarding the faculty’s infrastructure, please refer to the Vice Dean for infrastructure.

All our large-scale facilities are listed at the webpage of BMBWF (Austrian Federal Ministry of Education, Science and Research) under Research Infra­structures in Austria.

 


Information about the search function
You can either search all entries for a particular term (e.g. name of the devices; contact person...), or use the filter to display all devices of a certain category. Unfortunately, it is not possible to combine these two search methods. If you want to change your selected category after conducting your search, you first have to select [All categories].

For a list of all devices at an institute/department, enter a core term of the English institute name (e.g. mineralogy) in the search field.

Reflected-light microscope

Zeiss A1 Imager for quantitative ore microscopy with a J&M TIDAS-S CCD UV/NIR microspectrometer (190 – 980 nm)

Microscopy, Spectrometry / Spectroscopy

Reflected-light microscope (VHN)

Olympus BX51 for quantitative ore microscopy with an Anton Paar MHT-4 microindentation tester and Jenoptik Gryphax NAOS camera.

Microscopy

Scanning Electron Microscope (SEM) Inspect S-50

Fei Inspect S. Equipped with secondary electron detectors for operation at high and low vacuums, back scattered electron and cathodoluminescence...

Microscopy

Scanning Electron Microscope (SEM) Jeol 6400

Jeol high-vacuum scanning electron microscope with LINK Oxford energy-dispersive X-ray spectroscopy

 

Microscopy

Scanning Electron microscopy and Focused Ion Beam System

FEI QuantaTM 3D FEG Field-Emission-Gun Scanning Electron Microscope with integrated Focused Ion Beam System

Microscopy

Stereomicroscope

Zeiss motorized research stereomicroscope with Axiocam Icc 5 digital camera and software equipment for horizontal scanning picture mode, Discovery...

Microscopy