Scanning Electron Microscope (SEM) Inspect S-50

Fei Inspect S. Equipped with secondary electron detectors for operation at high and low vacuums, back scattered electron and cathodoluminescence detectors and EDAX unit

Contact: Univ.-Prof. Dr. Jürgen Kriwet (juergen.kriwet@univie.ac.at)

located: Department of Palaeontology (IfP)

Category: Microscopy

Please note

Please contact dekanat.fgga@univie.ac.at, if the contact person has not responded in due course.