Scanning Electron microscopy and Focused Ion Beam System

FEI QuantaTM 3D FEG Field-Emission-Gun Scanning Electron Microscope with integrated Focused Ion Beam System

Contact: Mag. Dr. Gerlinde Habler (gerlinde.habler@univie.ac.at)

located: Department of Lithospheric Research (DfL)

Category: Microscopy

Please note

Please contact dekanat.fgga@univie.ac.at, if the contact person has not responded in due course.