In Situ X-Ray Synchrotron Profile Analysis During High Pressure Torsion of Ti
- Autor(en)
- Erhard Schafler, Michael B. Kerber, Florian Spieckermann, Torben Fischer, Roman Schuster, Cornelia von Baeckmann
- Abstrakt
X-Ray Line Profile Analysis is a powerful method to characterize the microstructure of deformed materials, especially when high energy and brilliant Synchrotron radiation enables investigations with high time and spatial resolution. Parameters like dislocation density, dislocation arrangement as well as scattering domain size and it's distribution are parameters of a physical model of peak broadening, which can be applied to high quality diffraction measurements. A small high-pressure-torsion-machine was designed in order to perform in situ diffraction experiments during the deformation process at hydrostatic pressures up to 8 GPa in order to follow the strain as well as pressure induced microstructural characteristics of any material deformed. This was possible with the ideal design and equipment at the High-Energy-Materials-Science-beamline at PETRA III in Hamburg. Recent and First results of experiments on HPT-deformed Ti show that at 6 GPa the high pressure x-phase is initiated only with additional shear deformation.
- Organisation(en)
- Physik Nanostrukturierter Materialien, Department für Lithosphärenforschung, Institut für Funktionelle Materialien und Katalyse
- Externe Organisation(en)
- Montanuniversität Leoben, Deutsches Elektronen-Synchrotron DESY
- Seiten
- 645-651
- Anzahl der Seiten
- 7
- DOI
- https://doi.org/10.1007/978-3-319-52392-7_89
- Publikationsdatum
- 2017
- Peer-reviewed
- Ja
- ÖFOS 2012
- 103018 Materialphysik
- Schlagwörter
- ASJC Scopus Sachgebiete
- Electronic, Optical and Magnetic Materials, Mechanics of Materials, Metals and Alloys, Energy Engineering and Power Technology, Materials Chemistry
- Link zum Portal
- https://ucrisportal.univie.ac.at/de/publications/4ac246a5-9e3b-45ea-9122-dea5d45b6258