Field-Emission Gun Scanning Electron Microscopy and Focused Ion Beam System

FEI QuantaTM 3D FEG Field-Emission-Gun Scanning Electron Microscope with integrated Focused Ion Beam System

Contact: Mag. Dr. Gerlinde Habler (gerlinde.habler@univie.ac.at)

located: Department of Lithospheric Research (DfL)

 

internal information: IP543015

Category: Microscopy

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